The presence of monovalent Cs in Zn site basically creates a hole, which tends to form p-type conduction. The decrease in the number of interstitial Zn atoms and/or the reduction of O vacancies is the reason for the increment in resistivity of ZnO:Cs2CO3 films. Table 1 Lattice parameters, FWHM, and grain size of ZnO and ZnO:Cs 2 CO 3 Thin film a(Å) c(Å) 2θ (Selleckchem Luminespib degree) FWHM (degree) Grain size (nm) Resistivity (ohm cm) ZnO 3.2374 5.1823 34.589 0.220 66 2.2 × 10−3 ZnO:Cs2CO3 3.2382 5.1835 34.601 0.146 99.46 5.7 × 10−2 v-J-V, EQE, and stability characteristics Figure 5a shows the J-V characteristics Citarinostat cell line for P3HT:PCBM-based devices
with different electron and hole buffer layers: ZnO and PEDOT:PSS (device A) and ZnO:Cs2CO3 and PEDOT:PSS (device B (Figure 5a)). As we can see from the device B with ZnO and PEDOT:PSS as electron and hole buffer layers, respectively, the short-circuit current density (Jsc) is 8.42 mA/cm2; open-circuit voltage (Voc) is 0.60 V; and fill factor (FF) is 57.7%, along with power conversion efficiency (PCE) of about 2.89%. As we introduced Cs2CO3 to the ZnO film (device B), the Jsc, and FF increase slightly
to 8.72 mA/cm2 and 59.3%, respectively. However, the Voc remains unchanged. The increments in Jsc and FF lead to an improvement in PCE to 3.12%. The improved Jsc can be attributed to interface modification by removing the trap states at the interface of the ZnO. When the surface of ZnO is modified Montelukast Sodium with this dipole, the average conversion efficiency is further improved by 8% compared to devices without this dipole. SCH772984 in vitro Meanwhile, the improved FF can be attributed to the dipole on the Cs2CO3, which helps to enhance charge selectivity and reduce the
charge recombination losses at the interface. It is worth to note that as the FF increases from device A to device B, the Rs decreases to lower values, where the Rs for devices A and B is 1,333 and 1,176 ohm cm2, respectively. This indicates that the interface modification reduces the Rs of the device. The series and shunt resistances are determined from the inverse gradient of the J-V curve at 1 V and at the short-circuit current density under illumination. Figure 5 J-V characteristics of P3HT:PCBM- and P3HT:ICBA-based devices. (a) Device A (ZnO and PEDOT:PSS), device B (ZnO:Cs2CO3 and PEDOT:PSS), and (b) device C (ZnO and PEDOT:PSS), device D (ZnO:Cs2CO3 and PEDOT:PSS). External quantum efficiency of P3HT:PCBM and P3HT:ICBA-based devices; (c) device A (ZnO and PEDOT:PSS), device B (ZnO:Cs2CO3 and PEDOT:PSS), and (d) device C (ZnO and PEDOT:PSS), device D (ZnO:Cs2CO3 and PEDOT:PSS). An important issue is to check whether the work function shifts are also reflected in the performance of devices when other active materials are used.